Jorge assists in the drafting of U.S. and foreign patent applications for clients primarily in the software and hardware industries.

While attending UCLA as a graduate student, Jorge worked at the university’s Nanostructure Devices and Technology Laboratory as a researcher in the area of nanoarchitectonics and nanotheranostics, interdisciplinary fields dealing with nanoscience, medical therapy and disease diagnostics.

    • Publications
      • Integrated Device-Fabric Explorations and Noise Mitigation in Nanoscale Fabrics, IEEE Transactions on Nanotechnology, 2012.
      • Heterogeneous Integration of Epitaxial Nanostructures - Strategies and Application Drivers, SPIE Optics and Photonic Meeting, 2012 Aug. 12-16.
      • On-Chip Variation Sensor for Systematic Variation Estimation in Nanoscale Fabrics, IEEE 12th International Conference on Nanotechnology, 2012 Aug. 20-23.
      • Variability in Nanoscale Fabrics: Bottom-up Integrated Analysis and Mitigation, ACM Journal on Emerging Technologies in Computing Systems, 2012.
      • Smart Diagnostics Capsule with a Novel Antenna and Nano-Biosensors, presented at the 6th European Conference on Antennas and Propagation (EuCAP), 2012 March 26-30.
      • Integrated Nanosystems with Junctionless Crossed Nanowire Transistors, IEEE 11th International Conference on Nanotechnology, 2011, Aug. 15-18.
      • Nanoscale Application Specific Integrated Circuits, IEEE/ACM International Symposium on Nanoscale Architectures, 2011 June 8-9.
      • 3D Integrable Nanowire FET Sensor with Intrinsic Sensitivity Boost, IEEE International Conference on Integrated Circuit Design and Technology, 2011 May 2-4.
      • Parameter Variability in Nanoscale Fabrics: Bottom-up Integrated Exploration, 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010 Oct. 6-8

    Education & Admissions

    M.S., Electrical Engineering
    University of California, Los Angeles

    B.S., Electrical Engineering
    University of California, Los Angeles

    Registered to practice before the U.S. Patent and Trademark Office


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